发明申请
- 专利标题: Methods for depositing tungsten layers employing atomic layer deposition techniques
- 专利标题(中): 使用原子层沉积技术沉积钨层的方法
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申请号: US10418728申请日: 2003-04-18
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公开(公告)号: US20060040052A1公开(公告)日: 2006-02-23
- 发明人: Hongbin Fang , Hyungsuk Yoon , Ken Lai , Chi Young , Chao-Ming Huang , Ming Xi , Michael Yang , Hua Chung
- 申请人: Hongbin Fang , Hyungsuk Yoon , Ken Lai , Chi Young , Chao-Ming Huang , Ming Xi , Michael Yang , Hua Chung
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
A method for forming a tungsten layer on a substrate surface is provided. In one aspect, the method includes positioning the substrate surface in a processing chamber and exposing the substrate surface to a soak. A nucleation layer is then deposited on the substrate surface in the same processing chamber by alternately pulsing a tungsten-containing compound and a reducing gas selected from a group consisting of silane, disilane, dichlorosilane and derivatives thereof. A tungsten bulk layer may then be deposited on the nucleation layer using cyclical deposition, chemical vapor deposition, or physical vapor deposition techniques.
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