Invention Application
- Patent Title: Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
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Application No.: US11222932Application Date: 2005-09-08
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Publication No.: US20060076503A1Publication Date: 2006-04-13
- Inventor: Chun-Cheng Tsao
- Applicant: Chun-Cheng Tsao
- Applicant Address: US CA Milpitas
- Assignee: Credence Systems Corporation
- Current Assignee: Credence Systems Corporation
- Current Assignee Address: US CA Milpitas
- Main IPC: H01J3/14
- IPC: H01J3/14 ; G21K5/10 ; G01K1/08 ; A61N5/00

Abstract:
An optical coupling apparatus for a dual column charged particle beam tool allowing both optical imaging of an area of an integrated circuit, as well as localized heating of the integrated circuit to form silicide. In one embodiment, optical paths from a whitelight source and a laser source are coupled together by way of first and second beam splitters so that a single optical port of the dual column tool may be utilized for both imaging and heating. In another embodiment, a single laser source is employed to provide both illumination for standard microscopy-type imaging, as well as localized heating. In a third embodiment, a single laser source provides heating along with localized illumination for confocal scanning microscopy-type imaging.
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