- 专利标题: Exchange bias structure for abutted junction GMR sensor
-
申请号: US11375323申请日: 2006-03-14
-
公开(公告)号: US20060164766A1公开(公告)日: 2006-07-27
- 发明人: Yun-Fei Li , Hui-Chuan Wang , Chyu-Jiuh Torng , Cherng-Chyi Han , Mao-Min Chen
- 申请人: Yun-Fei Li , Hui-Chuan Wang , Chyu-Jiuh Torng , Cherng-Chyi Han , Mao-Min Chen
- 专利权人: HEADWAY TECHNOLOGIES, INC.
- 当前专利权人: HEADWAY TECHNOLOGIES, INC.
- 主分类号: G11B5/33
- IPC分类号: G11B5/33 ; B05D5/12 ; G11B5/127
摘要:
Although it is known that exchange bias can be utilized in abutted junctions for longitudinal stabilization, a relatively large moment is needed to pin down the sensor edges effectively. Due to the inverse dependence of the exchange bias on the magnetic layer thickness, a large exchange bias has been difficult to achieve by the prior art. This problem has been solved by introducing a structure in which the magnetic moment of the bias layer has been approximately doubled by pinning it from both above and below through exchange with antiferromagnetic layers. Additionally, since the antiferromagnetic layer is in direct abutted contact with the free layer, it acts directly to help stabilize the sensor edge, which is an advantage over the traditional magnetostatic pinning that had been used.
公开/授权文献
- US07529067B2 Exchange bias structure for abutted junction GMR sensor 公开/授权日:2009-05-05
信息查询
IPC分类: