发明申请
US20060237785A1 Strained complementary metal oxide semiconductor (CMOS) on rotated wafers and methods thereof 有权
旋转晶片上的应变互补金属氧化物半导体(CMOS)及其方法

Strained complementary metal oxide semiconductor (CMOS) on rotated wafers and methods thereof
摘要:
The present invention provides CMOS structures including at least one strained pFET that is located on a rotated semiconductor substrate to improve the device performance. Specifically, the present invention utilizes a Si-containing semiconductor substrate having a (100) crystal orientation in which the substrate is rotated by about 45° such that the CMOS device channels are located along the direction. Strain can be induced upon the CMOS structure including at least a pFET and optionally an nFET, particularly the channels, by forming a stressed liner about the FET, by forming embedded stressed wells in the substrate, or by utilizing a combination of embedded stressed wells and a stressed liner. The present invention also provides methods for fabricating the aforesaid semiconductor structures.
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