发明申请
- 专利标题： Adapting scan-BIST architectures for low power operation
- 专利标题（中）： 适应扫描BIST架构，实现低功耗操作
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申请号： US11278064申请日： 2006-03-30
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公开(公告)号： US20060242520A1公开(公告)日： 2006-10-26
- 发明人: Lee Whetsel
- 申请人： Lee Whetsel
- 申请人地址： US TX Dallas 75251
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： US TX Dallas 75251
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known scan path into scan path 502, to insert scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and scan path 502.
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