发明申请
US20060244151A1 OBLIQUE RECESS FOR INTERCONNECTING CONDUCTORS IN A SEMICONDUCTOR DEVICE
审中-公开
用于在半导体器件中互连导体的OBLIQUE RECESS
- 专利标题: OBLIQUE RECESS FOR INTERCONNECTING CONDUCTORS IN A SEMICONDUCTOR DEVICE
- 专利标题(中): 用于在半导体器件中互连导体的OBLIQUE RECESS
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申请号: US10908204申请日: 2005-05-02
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公开(公告)号: US20060244151A1公开(公告)日: 2006-11-02
- 发明人: CHEN-HUA YU , CHENG-LIN HUANG , SHAU-LIN SHUE , CHING-HUA HSIEH , SHING-CHYANG PAN , HSIEN-MING LEE LEE , HSUEH-HUNG FU
- 申请人: CHEN-HUA YU , CHENG-LIN HUANG , SHAU-LIN SHUE , CHING-HUA HSIEH , SHING-CHYANG PAN , HSIEN-MING LEE LEE , HSUEH-HUNG FU
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L23/48
- IPC分类号: H01L23/48
摘要:
Semiconductor devices having an oblique metal recess for receiving metal during metallization processes are described. In one example, a semiconductor device includes a dielectric layer formed over a conductive pad disposed in a substrate. The conductive pad is etched to include an oblique recess, which interfaces with a metal deposited during a metallization process. Related methods for forming such metal contacts and interconnections for the semiconductor device are also described.
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