Reducing Resistance in Source and Drain Regions of FinFETs
    2.
    发明申请
    Reducing Resistance in Source and Drain Regions of FinFETs 有权
    降低FinFET源极和漏极区域的电阻

    公开(公告)号:US20110223735A1

    公开(公告)日:2011-09-15

    申请号:US13103594

    申请日:2011-05-09

    IPC分类号: H01L21/336 H01L21/20

    摘要: A semiconductor structure includes a semiconductor fin on a top surface of a substrate, wherein the semiconductor fin includes a middle section having a first width; and a first and a second end section connected to opposite ends of the middle section, wherein the first and the second end sections each comprises at least a top portion having a second width greater than the first width. The semiconductor structure further includes a gate dielectric layer on a top surface and sidewalls of the middle section of the semiconductor fin; and a gate electrode on the gate dielectric layer.

    摘要翻译: 半导体结构包括在基板的顶面上的半导体翅片,其中半导体鳍片包括具有第一宽度的中间部分; 以及连接到中间部分的相对端部的第一和第二端部分,其中第一和第二端部部分至少包括具有大于第一宽度的第二宽度的顶部部分。 半导体结构还包括在半导体鳍片的顶表面和中间部分的侧壁上的栅介质层; 以及栅极电介质层上的栅电极。