发明申请
- 专利标题: Silicon dot forming method and silicon dot forming apparatus
- 专利标题(中): 硅点形成方法和硅点形成装置
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申请号: US11519967申请日: 2006-09-13
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公开(公告)号: US20070056846A1公开(公告)日: 2007-03-15
- 发明人: Eiji Takahashi , Atsushi Tomyo , Kenji Kato , Takashi Mikami , Tsukasa Hayashi
- 申请人: Eiji Takahashi , Atsushi Tomyo , Kenji Kato , Takashi Mikami , Tsukasa Hayashi
- 专利权人: NISSIN ELECTRIC CO., LTD.
- 当前专利权人: NISSIN ELECTRIC CO., LTD.
- 优先权: JP2005-264939 20050913
- 主分类号: C23C14/00
- IPC分类号: C23C14/00
摘要:
A substrate is accommodated in a vacuum chamber provided with a silicon sputter target, a sputtering gas (typically a hydrogen gas) is supplied into the vacuum chamber, a high-frequency power is applied to the gas to form plasma in the chamber, a bias voltage is applied to the target for control of chemical sputtering, and the chemical sputtering is effected on the target by the plasma to form silicon dots on the substrate.
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