发明申请
US20070085007A1 Charged particle beam device with DF-STEM image valuation method
有权
带有DF-STEM图像估价方法的带电粒子束装置
- 专利标题: Charged particle beam device with DF-STEM image valuation method
- 专利标题(中): 带有DF-STEM图像估价方法的带电粒子束装置
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申请号: US11582955申请日: 2006-10-19
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公开(公告)号: US20070085007A1公开(公告)日: 2007-04-19
- 发明人: Mine Araki , Shunya Watanabe , Chisato Kamiya , Mitsugu Sato , Atsushi Takane , Akinari Morikawa , Atsushi Miyaki , Toru Ishitani
- 申请人: Mine Araki , Shunya Watanabe , Chisato Kamiya , Mitsugu Sato , Atsushi Takane , Akinari Morikawa , Atsushi Miyaki , Toru Ishitani
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 优先权: JP2005-303815 20051019; JP2006-035898 20060214
- 主分类号: G21K7/00
- IPC分类号: G21K7/00
摘要:
There is disclosed a charged particle beam device which judges whether or not an image based on a dark-field signal has an appropriate atomic number contrast. Input reference information, a bright-field image or a back-scattered electron image is compared with a dark-field image, and it is judged whether or not a correlation value between them or the dark-field image has a predetermined contrast. According to such a constitution, it is possible to obtain information by which it is judged whether or not the dark-field image has an appropriate atomic number contrast.
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