发明申请
US20070085007A1 Charged particle beam device with DF-STEM image valuation method 有权
带有DF-STEM图像估价方法的带电粒子束装置

Charged particle beam device with DF-STEM image valuation method
摘要:
There is disclosed a charged particle beam device which judges whether or not an image based on a dark-field signal has an appropriate atomic number contrast. Input reference information, a bright-field image or a back-scattered electron image is compared with a dark-field image, and it is judged whether or not a correlation value between them or the dark-field image has a predetermined contrast. According to such a constitution, it is possible to obtain information by which it is judged whether or not the dark-field image has an appropriate atomic number contrast.
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