Invention Application
- Patent Title: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Patent Title (中): 半导体器件及其制造方法
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Application No.: US11617936Application Date: 2006-12-29
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Publication No.: US20070105329A1Publication Date: 2007-05-10
- Inventor: Toshiaki Iwamatsu , Takashi Ipposhi
- Applicant: Toshiaki Iwamatsu , Takashi Ipposhi
- Applicant Address: JP Tokyo
- Assignee: Renesas Technology Corp.
- Current Assignee: Renesas Technology Corp.
- Current Assignee Address: JP Tokyo
- Priority: JP2003-422762 20031219
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L21/8222

Abstract:
Plural trench isolation films are provided with portions of an SOI layer interposed therebetween in a surface of the SOI layer in a resistor region (RR) where a spiral inductor (SI) is to be provided. Resistive element are formed on the trench isolation films, respectively. Each of the trench isolation films includes a central portion which passes through the SOI layer and reaches a buried oxide film to include a full-trench isolation structure, and opposite side portions each of which passes through only a portion of the SOI layer and is located on the SOI layer to include a partial-trench isolation structure. Thus, each of the trench isolation films includes a hybrid-trench isolation structure.
Public/Granted literature
- US07453135B2 Semiconductor device and method of manufacturing the same Public/Granted day:2008-11-18
Information query
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