发明申请
US20070235059A1 Method of recovering valuable material from exhaust gas stream of a reaction chamber 有权
从反应室的废气流中回收有价物质的方法

Method of recovering valuable material from exhaust gas stream of a reaction chamber
摘要:
A semiconductor processing chamber is cleaned by introducing a cleaning gas into a processing chamber, striking a plasma in a remote plasma source that is in communication with the processing chamber, measuring the impedance of the plasma, vaporizing a ruthenium containing deposit on a surface of the processing chamber to form a ruthenium containing gas mixture, and flowing the gas mixture through an analyzer and into an exhaust collection assembly. The measurement of the impedance of the plasma in combination with the ruthenium concentration provides an accurate indication of chamber cleanliness.
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