发明申请
US20080083427A1 POST ETCH RESIDUE REMOVAL FROM SUBSTRATES 审中-公开
从基材中去除填充残留物

POST ETCH RESIDUE REMOVAL FROM SUBSTRATES
摘要:
A method for removing residue from a workpiece includes preparing a liquid including de-ionized water, sulfuric acid, and optionally hydrofluoric acid. Carbon dioxide gas is provided into the liquid. The liquid is maintained at a desired temperature. The liquid is applied onto a workpiece in a process chamber. The liquid may be formed into a liquid layer on the workpiece having a controlled thickness. Ozone gas may be introduced into the chamber and chemically reacts with residue on the workpiece. In a second separate method the liquid includes de-ionized water, highly dilute hydrofluoric acid and carbon dioxide, with no need for ozone gas.
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