发明申请
- 专利标题: Substrate polishing apparatus and method
- 专利标题(中): 基材抛光装置及方法
-
申请号: US11905687申请日: 2007-10-03
-
公开(公告)号: US20080085658A1公开(公告)日: 2008-04-10
- 发明人: Seiji Katsuoka , Masahiko Sekimoto , Junji Kunisawa , Mitsuru Miyazaki , Teruyuki Watanabe , Kenichi Kobayashi , Masayuki Kumekawa , Toshio Yokoyama
- 申请人: Seiji Katsuoka , Masahiko Sekimoto , Junji Kunisawa , Mitsuru Miyazaki , Teruyuki Watanabe , Kenichi Kobayashi , Masayuki Kumekawa , Toshio Yokoyama
- 优先权: JP2006-275857 20061006; JP2007-225805 20070831
- 主分类号: B24B55/02
- IPC分类号: B24B55/02
摘要:
A substrate polishing apparatus includes a substrate holding mechanism having a head for holding a substrate to be polished, and a polishing mechanism including a polishing table with a polishing pad mounted thereon. The substrate held by the head is pressed against the polishing pad on the polishing table to polish the substrate by relative movement of the substrate and the polishing pad. The substrate polishing apparatus also includes a substrate transfer mechanism for delivering the substrate to be polished to the head and receiving the polished substrate. The substrate transfer mechanism includes a substrate to-be-polished receiver for receiving the substrate to be polished, and a polished substrate receiver for receiving the substrate which has been polished.
公开/授权文献
- US07585205B2 Substrate polishing apparatus and method 公开/授权日:2009-09-08
信息查询