发明申请
US20080142900A1 ABRUPT METAL-INSULATOR TRANSITION DEVICE, CIRCUIT FOR REMOVING HIGH-VOLTAGE NOISE USING THE ABRUPT METAL-INSULATOR TRANSITION DEVICE, AND ELECTRICAL AND/OR ELECTRONIC SYSTEM COMPRISING THE CIRCUIT
有权
用于使用破坏金属绝缘体过渡装置以及包括电路的电气和/或电子系统来消除高压噪声的电路的绝缘金属绝缘体过渡装置
- 专利标题: ABRUPT METAL-INSULATOR TRANSITION DEVICE, CIRCUIT FOR REMOVING HIGH-VOLTAGE NOISE USING THE ABRUPT METAL-INSULATOR TRANSITION DEVICE, AND ELECTRICAL AND/OR ELECTRONIC SYSTEM COMPRISING THE CIRCUIT
- 专利标题(中): 用于使用破坏金属绝缘体过渡装置以及包括电路的电气和/或电子系统来消除高压噪声的电路的绝缘金属绝缘体过渡装置
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申请号: US12021764申请日: 2008-01-29
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公开(公告)号: US20080142900A1公开(公告)日: 2008-06-19
- 发明人: Hyun Tak KIM , Kwang Yong KANG , Bong Jun KIM , Yong Wook LEE , Sun Jin YUN , Byung Gyu CHAE , Gyung Ock KIM
- 申请人: Hyun Tak KIM , Kwang Yong KANG , Bong Jun KIM , Yong Wook LEE , Sun Jin YUN , Byung Gyu CHAE , Gyung Ock KIM
- 申请人地址: KR Daejeon-city
- 专利权人: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人地址: KR Daejeon-city
- 优先权: KR10-2005-0069805 20050729; KR10-2005-0124045 20051215
- 主分类号: H01L29/76
- IPC分类号: H01L29/76
摘要:
Provided are an abrupt metal-insulator transition (MIT) device for bypassing super-high voltage noise to protect an electric and/or electronic system, such as, a high-voltage switch, from a super-high voltage, a high-voltage noise removing circuit for bypassing the super-high voltage noise using the abrupt MIT device, and an electric and/or electronic system including the high-voltage noise removing circuit. The abrupt MIT device includes a substrate, a first abrupt MIT structure, and a second abrupt MIT structure. The first and second abrupt MIT structures are formed on an upper surface and a lower surface, respectively, of the substrate. The high-voltage noise removing circuit includes an abrupt MIT device chain connected in parallel to the electric and/or electronic system to be protected. The abrupt MIT device chain includes at least two abrupt MIT devices serially connected to each other.
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