发明申请
- 专利标题: Memory Element and Semiconductor Device
- 专利标题(中): 存储器元件和半导体器件
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申请号: US11795476申请日: 2006-02-07
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公开(公告)号: US20080149733A1公开(公告)日: 2008-06-26
- 发明人: Mikio Yukawa , Tamae Takano , Yoshinobu Asami , Shunpei Yamazaki , Takehisa Sato
- 申请人: Mikio Yukawa , Tamae Takano , Yoshinobu Asami , Shunpei Yamazaki , Takehisa Sato
- 申请人地址: JP JAPAN
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP JAPAN
- 优先权: JP2005-035297 20050210
- 国际申请: PCT/JP06/02413 WO 20060207
- 主分类号: G06K19/07
- IPC分类号: G06K19/07 ; H01L29/00 ; G11C17/00
摘要:
It is an object of the present invention to provide a nonvolatile memory device, in which additional writing is possible other than in manufacturing and forgery and the like due to rewriting can be prevented, and a semiconductor device having the memory device. It is another object of the present invention to provide an inexpensive and nonvolatile memory device with high reliability and a semiconductor device. According to one feature of the present invention, a memory device includes a first conductive layer formed over an insulating surface, a second conductive layer, a first insulating layer interposed between the first conductive layer and the second conductive layer, and a second insulating layer which covers a part of the first conductive layer, wherein the first insulating layer covers an edge portion of the first conductive layer, the insulating surface, and the second insulating layer.
公开/授权文献
- US08604547B2 Memory element and semiconductor device 公开/授权日:2013-12-10
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