发明申请
US20080151258A1 SHAPE MEASURING APPARATUS, SHAPE MEASURING METHOD, AND EXPOSURE APPARATUS 有权
形状测量装置,形状测量方法和曝光装置

  • 专利标题: SHAPE MEASURING APPARATUS, SHAPE MEASURING METHOD, AND EXPOSURE APPARATUS
  • 专利标题(中): 形状测量装置,形状测量方法和曝光装置
  • 申请号: US11942348
    申请日: 2007-11-19
  • 公开(公告)号: US20080151258A1
    公开(公告)日: 2008-06-26
  • 发明人: Takahiro MatsumotoRyo Sasaki
  • 申请人: Takahiro MatsumotoRyo Sasaki
  • 申请人地址: JP Tokyo
  • 专利权人: CANON KABUSHIKI KAISHA
  • 当前专利权人: CANON KABUSHIKI KAISHA
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2006-346203 20061222; JP2007-278962 20071026
  • 主分类号: G01B9/023
  • IPC分类号: G01B9/023
SHAPE MEASURING APPARATUS, SHAPE MEASURING METHOD, AND EXPOSURE APPARATUS
摘要:
A shape measuring method for measuring a surface shape of a measurement target includes dividing light from a light source into measurement light and reference light, the measurement light being obliquely incident upon a surface of the measurement target, the reference light being incident upon a reference mirror, introducing the measurement light reflected by the measurement target and the reference light reflected by the reference mirror to a photoelectric conversion element, detecting interference light formed by the measurement light and the reference light by the photoelectric conversion element while moving the measurement target, and measuring the surface shape of the measurement target based on an interference signal obtained from the measurement light that has been reflected at the same position on the surface of the measurement target.
信息查询
0/0