发明申请
US20080242880A1 COPPER PRECURSORS FOR CVD/ALD/DIGITAL CVD OF COPPER METAL FILMS
有权
铜金属膜CVD / ALD /数字CVD的铜前驱体
- 专利标题: COPPER PRECURSORS FOR CVD/ALD/DIGITAL CVD OF COPPER METAL FILMS
- 专利标题(中): 铜金属膜CVD / ALD /数字CVD的铜前驱体
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申请号: US12058751申请日: 2008-03-30
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公开(公告)号: US20080242880A1公开(公告)日: 2008-10-02
- 发明人: Tianniu Chen , Chongying Xu , Thomas H. Baum , Bryan C. Hendrix , Jeffrey F. Roeder , Juan E. Dominguez , Adrien R. Lavoie , Harsono S. Simka
- 申请人: Tianniu Chen , Chongying Xu , Thomas H. Baum , Bryan C. Hendrix , Jeffrey F. Roeder , Juan E. Dominguez , Adrien R. Lavoie , Harsono S. Simka
- 主分类号: C07F1/08
- IPC分类号: C07F1/08 ; C09D5/00 ; C23C16/54
摘要:
Copper precursors useful for depositing copper or copper-containing films on substrates, e.g., microelectronic device substrates or other surfaces. The precursors includes copper compounds of various classes, including copper borohydrides, copper compounds with cyclopentadienyl-type ligands, copper compounds with cyclopentadienyl-type and isocyanide ligands, and stabilized copper hydrides. The precursors can be utilized in solid or liquid forms that are volatilized to form precursor vapor for contacting with the substrate, to form deposited copper by techniques such as chemical vapor deposition (CVD), atomic layer deposition (ALD) or rapid vapor deposition (digital CVD).
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