发明申请
- 专利标题： PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING APPARATUS
- 专利标题（中）： 探头组件，生产电气连接装置的方法
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申请号： US11912872申请日： 2005-05-23
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公开(公告)号： US20090058440A1公开(公告)日： 2009-03-05
- 发明人: Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
- 申请人： Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
- 申请人地址： JP Tokyo
- 专利权人： KABUSHIKI KAISHA NIHON MICRONICS
- 当前专利权人： KABUSHIKI KAISHA NIHON MICRONICS
- 当前专利权人地址： JP Tokyo
- 国际申请： PCT/JP2005/009812 WO 20050523
- 主分类号： G01R1/073
- IPC分类号： G01R1/073 ; G01R3/00
摘要：
A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
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