发明申请
US20090162800A1 Process for Imaging a Photoresist Coated over an Antireflective Coating
审中-公开
在抗反射涂层上涂覆光刻胶的方法
- 专利标题: Process for Imaging a Photoresist Coated over an Antireflective Coating
- 专利标题(中): 在抗反射涂层上涂覆光刻胶的方法
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申请号: US11961581申请日: 2007-12-20
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公开(公告)号: US20090162800A1公开(公告)日: 2009-06-25
- 发明人: David Abdallah , Alberto Dioses , Allen Timko , Ruzhi Zhang
- 申请人: David Abdallah , Alberto Dioses , Allen Timko , Ruzhi Zhang
- 主分类号: G03F7/30
- IPC分类号: G03F7/30
摘要:
The process of the present invention relates to imaging a photoresist film coated over an antireflective coating film comprising a) forming an antireflective coating film from an antireflective coating composition, where the composition comprises a siloxane polymer, b) treating the antireflective film with an aqueous alkaline treating solution, c) rinsing the antireflective film treated with an aqueous rinsing solution, d) forming a coating of a photoresist over the film of the antireflective coating composition, e) imagewise exposing the photoresist film, and, f) developing the photoresist with an aqueous alkaline developing solution.
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