HIGH SILICON-CONTENT THIN FILM THERMOSETS
    5.
    发明申请
    HIGH SILICON-CONTENT THIN FILM THERMOSETS 失效
    高硅含量薄膜热敏电阻

    公开(公告)号:US20080008954A1

    公开(公告)日:2008-01-10

    申请号:US11425817

    申请日:2006-06-22

    IPC分类号: G03C1/00

    摘要: High silicon-content resin composition that can be used to form thin film thermosets, useful in forming low k dielectric constant materials and as well as hard mask materials with anti-reflective properties for the photolithography industry are disclosed.

    摘要翻译: 公开了可用于形成薄膜热固性材料的高含硅树脂组合物,其可用于形成低k介电常数材料以及具有用于光刻工业的抗反射性能的硬掩模材料。

    Antireflective Coating Compositions Comprising Siloxane Polymer
    10.
    发明申请
    Antireflective Coating Compositions Comprising Siloxane Polymer 审中-公开
    包含硅氧烷聚合物的抗反射涂料组合物

    公开(公告)号:US20070298349A1

    公开(公告)日:2007-12-27

    申请号:US11425813

    申请日:2006-06-22

    IPC分类号: G03C1/00

    摘要: The present invention relates to a novel antireflective coating composition for forming an underlayer for a photoresist comprising an acid generator and a novel siloxane polymer, where the siloxane polymer comprises at least one absorbing chromophore and at least one self-crosslinking functionality of structure (1), where m is 0 or 1, W and W′ are independently a valence bond or a connecting group linking the cyclic ether to the silicon of the polymer and L is selected from hydrogen, W′ and W, or L and W′ are combined to comprise a cycloaliphatic linking group linking the cyclic ether to the silicon of the polymer. The invention also relates to a process for imaging the photoresist coated over the novel antireflective coating composition and provides good lithographic results. The invention further relates to a novel siloxane polymer, where the siloxane polymer comprises at least one absorbing chromophore and at least one self-crosslinking functionality of structure (1).

    摘要翻译: 本发明涉及一种用于形成光致抗蚀剂底层的新型抗反射涂料组合物,其包含酸产生剂和新型硅氧烷聚合物,其中硅氧烷聚合物包含至少一种吸收发色团和至少一种结构(1)的自交联官能团, 其中m为0或1,W和W'独立地为价键或连接环状醚与聚合物硅的连接基团,L选自氢,W'和W,或L和W'组合 包括将环醚与聚合物的硅连接的脂环族连接基团。 本发明还涉及一种用于对涂覆在新型抗反射涂料组合物上的光致抗蚀剂进行成像的方法,并提供良好的光刻结果。 本发明还涉及新的硅氧烷聚合物,其中硅氧烷聚合物包含至少一种吸收发色团和至少一种结构(1)的自交联官能团。