发明申请
US20090229977A1 Magnet Structure and Cathode Electrode Unit for Magnetron Sputtering System, and Magnetron Sputtering System
审中-公开
磁控溅射系统的磁体结构和阴极电极单元,以及磁控溅射系统
- 专利标题: Magnet Structure and Cathode Electrode Unit for Magnetron Sputtering System, and Magnetron Sputtering System
- 专利标题(中): 磁控溅射系统的磁体结构和阴极电极单元,以及磁控溅射系统
-
申请号: US12090465申请日: 2006-11-02
-
公开(公告)号: US20090229977A1公开(公告)日: 2009-09-17
- 发明人: Takahiko Kondo , Takanobu Hori , Yasukuni Iwasaki , Nobuo Yoneyama
- 申请人: Takahiko Kondo , Takanobu Hori , Yasukuni Iwasaki , Nobuo Yoneyama
- 申请人地址: JP Takarazuka-shi
- 专利权人: SHINMAYWA INDUSTRIES, LTD.
- 当前专利权人: SHINMAYWA INDUSTRIES, LTD.
- 当前专利权人地址: JP Takarazuka-shi
- 优先权: JP2005-321378 20051104
- 国际申请: PCT/JP2006/321950 WO 20061102
- 主分类号: C23C14/35
- IPC分类号: C23C14/35
摘要:
Provided are a magnet structure and the like capable of changing a magnetic force line distribution on a surface of a target to thereby achieve wide erosion of a target, using a simple drive mechanism. A magnet structure (110) comprises a main magnet (10, 13) disposed at a reverse surface (20B) side of a target (20) to produce a main magnetic force line reaching an obverse surface (20A) of the target, an adjustment magnet (11) disposed at the reverse surface (20B) side of the target (20) to produce an adjustment magnetic force line for changing a magnetic flux density distribution produced by the main magnetic force line, a magnetic path (21A, 21B, 24) of the adjustment magnetic force line which is disposed at the reverse surface (20B) side of the target 20, and a magnetic field adjustment means (12, 14) configured to be able to change strength of the adjustment magnetic force line passing through inside of the magnetic path (21A, 21B, 24).
信息查询
IPC分类: