- 专利标题: METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
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申请号: US12692790申请日: 2010-01-25
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公开(公告)号: US20100120226A1公开(公告)日: 2010-05-13
- 发明人: Shunpei Yamazaki , Ikuko Kawamata , Yasuyuki Arai
- 申请人: Shunpei Yamazaki , Ikuko Kawamata , Yasuyuki Arai
- 申请人地址: JP Kangawa-ken
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP Kangawa-ken
- 优先权: JP2007-079787 20070326
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
When single crystal semiconductor layers are transposed from a single crystal semiconductor substrate (a bond wafer), the single crystal semiconductor substrate is etched selectively (this step is also referred to as groove processing), and a plurality of single crystal semiconductor layers, which are being divided in size of manufactured semiconductor elements, are transposed to a different substrate (a base substrate). Thus, a plurality of island-shaped single crystal semiconductor layers (SOI layers) can be formed over the base substrate. Further, etching is performed on the single crystal semiconductor layers formed over the base substrate, and the shapes of the SOI layers are controlled precisely by being processed and modified.
公开/授权文献
- US07811884B2 Method for manufacturing semiconductor device 公开/授权日:2010-10-12
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