发明申请
US20100205504A1 Automatic refresh for improving data retention and endurance characteristics of an embedded non-volatile memory in a standard CMOS logic process 有权
自动刷新,以提高标准CMOS逻辑过程中嵌入式非易失性存储器的数据保留和耐久性

Automatic refresh for improving data retention and endurance characteristics of an embedded non-volatile memory in a standard CMOS logic process
摘要:
A method for selectively refreshing data in a nonvolatile memory array based on failure type detected by an error correction code. If the page is determined to be error-free, no refresh operation takes place. Otherwise, if single-error words on a page contain erased and programmed bit errors, then a refresh operation, consisting of an erase and program, takes place. The erase operation is skipped if single-error words on a page solely contain a program failure.
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