发明申请
- 专利标题: Testing An Electrical Component
- 专利标题(中): 测试电气部件
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申请号: US12402806申请日: 2009-03-12
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公开(公告)号: US20100231209A1公开(公告)日: 2010-09-16
- 发明人: Rubina F. Ahmed , Moises Cases , Bradley D. Herrman , Bhyrav M. Mutnury , Pravin Patel , Peter R. Seidel
- 申请人: Rubina F. Ahmed , Moises Cases , Bradley D. Herrman , Bhyrav M. Mutnury , Pravin Patel , Peter R. Seidel
- 申请人地址: US NY ARMONK
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY ARMONK
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
Testing an electrical component, the component including a printed circuit board (‘PCB’) with a number of traces, the traces organized in pairs with each trace of a pair carrying current in opposite directions and separated from one another by a substrate layer of the PCB, where testing of the electrical component includes: dynamically and iteratively until a present impedance for a pair of traces of the component is greater than a predetermined threshold impedance: increasing, by an impedance varying device at the behest of a testing device, magnetic field strength of a magnetic field applied to the pair of traces by the impedance varying device, including increasing the present impedance of the pair of traces; measuring, by the testing device, one or more operating parameters; and recording, by the testing device, the measurements of the operating parameters.
公开/授权文献
- US08106666B2 Testing an electrical component 公开/授权日:2012-01-31
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