发明申请
- 专利标题: FABRICATION OF LOW DEFECTIVITY ELECTROCHROMIC DEVICES
- 专利标题(中): 低缺陷电致发光器件的制造
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申请号: US12645111申请日: 2009-12-22
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公开(公告)号: US20100243427A1公开(公告)日: 2010-09-30
- 发明人: Mark Kozlowski , Eric Kurman , Zhongchun Wang , Mike Scobey , Jeremy Dixon , Anshu Pradhan , Robert Rozbicki
- 申请人: Mark Kozlowski , Eric Kurman , Zhongchun Wang , Mike Scobey , Jeremy Dixon , Anshu Pradhan , Robert Rozbicki
- 申请人地址: US CA Milpitas
- 专利权人: SOLADIGM, INC.
- 当前专利权人: SOLADIGM, INC.
- 当前专利权人地址: US CA Milpitas
- 主分类号: B05D5/12
- IPC分类号: B05D5/12 ; C23C16/00 ; C23C16/06 ; C23C16/52 ; C23C14/34
摘要:
Prior electrochromic devices frequently suffer from high levels of defectivity. The defects may be manifest as pin holes or spots where the electrochromic transition is impaired. This is unacceptable for many applications such as electrochromic architectural glass. Improved electrochromic devices with low defectivity can be fabricated by depositing certain layered components of the electrochromic device in a single integrated deposition system. While these layers are being deposited and/or treated on a substrate, for example a glass window, the substrate never leaves a controlled ambient environment, for example a low pressure controlled atmosphere having very low levels of particles. These layers may be deposited using physical vapor deposition.
公开/授权文献
- US09664974B2 Fabrication of low defectivity electrochromic devices 公开/授权日:2017-05-30
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