发明申请
US20110199138A1 Semiconductor device and test method thereof 审中-公开
半导体器件及其测试方法

  • 专利标题: Semiconductor device and test method thereof
  • 专利标题(中): 半导体器件及其测试方法
  • 申请号: US12929755
    申请日: 2011-02-14
  • 公开(公告)号: US20110199138A1
    公开(公告)日: 2011-08-18
  • 发明人: Yutaka Sano
  • 申请人: Yutaka Sano
  • 申请人地址: JP Kawasaki
  • 专利权人: Renesas Electronics Corporation
  • 当前专利权人: Renesas Electronics Corporation
  • 当前专利权人地址: JP Kawasaki
  • 优先权: JP2010-031194 20100216
  • 主分类号: H03L7/06
  • IPC分类号: H03L7/06
Semiconductor device and test method thereof
摘要:
A semiconductor device includes a PLL (Phase Locked Loop) circuit configured to generate a reception clock signal and a transmission clock signal based on a reference clock signal which has been subjected to frequency-modulation; a serializer configured to convert parallel data into serial data in response to the transmission clock signal to output the serial data; and a CDR (Clock Data Recovery) circuit configured to perform clock data recovery on reception data in response to the reception clock signal to output recovery data. A deserializer is configured to convert the recovery data into parallel data; and a loop-back line configured to supply the serial data outputted from the serializer to the CDR circuit as the reception data.
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