发明申请
- 专利标题: SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS CONTROL TECHNIQUE
- 专利标题(中): 半导体集成电路及其控制技术
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申请号: US13026241申请日: 2011-02-12
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公开(公告)号: US20110234297A1公开(公告)日: 2011-09-29
- 发明人: Tetsuya FUKUOKA , Yasuhiro Fujimura , Masanao Yamaoka
- 申请人: Tetsuya FUKUOKA , Yasuhiro Fujimura , Masanao Yamaoka
- 专利权人: HITACHI, LTD.
- 当前专利权人: HITACHI, LTD.
- 优先权: JPJP2010-074764 20100329
- 主分类号: H03K17/687
- IPC分类号: H03K17/687
摘要:
Provided is a control technique of a semiconductor integrated circuit capable by which power on/shut-off of a power shut-off area at an optimum speed in accordance with variations in fabricating devices as suppressing the malfunction of a circuit during operation in the power on/shut-off. A semiconductor integrated circuit includes: an always-on area; a power shut-off area; and a plurality of power-supply switches connected to the power shut-off area for supplying or shutting off the power to the power shut-off area.Further, the semiconductor integrated circuit includes a switch controller for carrying out the power on/shut-off by controlling on/off of the plurality of power-supply switches and changing the transition time of the power on/shut-off in accordance with a performance of each of the semiconductor integrated circuit after fabricating. Further, the semiconductor integrated circuit includes a memory for recording the performance of each of the semiconductor integrated circuit after fabricating.
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