发明申请
- 专利标题： TEST ELEMENT, TEST KIT, TEST DEVICE, AND TEST METHOD
- 专利标题（中）： 测试元件，测试套件，测试设备和测试方法
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申请号： US13207690申请日： 2011-08-11
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公开(公告)号： US20120064559A1公开(公告)日： 2012-03-15
- 发明人: Ichiro TONO , Takaaki Wada , Kayoko Oomiya , Shingo Kasai , Masaaki Hirakawa
- 申请人： Ichiro TONO , Takaaki Wada , Kayoko Oomiya , Shingo Kasai , Masaaki Hirakawa
- 申请人地址： JP Tokyo
- 专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人地址： JP Tokyo
- 优先权： JP2010-203118 20100910
- 主分类号： C12Q1/28
- IPC分类号： C12Q1/28 ; C12Q1/26 ; C12M1/34
摘要：
According to one embodiment, a test element includes a base, a pair of optical element units, an optical waveguide unit, a detection unit and a holding unit. The base has transparency. The pair of optical element units are arranged away from each other on a major surface of the base. The optical waveguide unit is provided on the major surface of the base. The detection unit is provided on a major surface of the optical waveguide unit of between the optical element units. The major surface of the optical waveguide unit is an opposite side which touches the base. The holding unit is in a frame shape, and one end of the holding unit being is provided to protrude from a major surface of the detection unit. The detection unit includes a color former and a film-formed body holding the color former.
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