发明申请
- 专利标题: SEMICONDUCOR DEVICE
- 专利标题(中): 半导体器件
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申请号: US13314326申请日: 2011-12-08
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公开(公告)号: US20120146109A1公开(公告)日: 2012-06-14
- 发明人: Shunpei Yamazaki , Hiromichi Godo , Yasuhiko Takemura
- 申请人: Shunpei Yamazaki , Hiromichi Godo , Yasuhiko Takemura
- 申请人地址: JP Atsugi-shi
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP Atsugi-shi
- 优先权: JP2010-274262 20101209
- 主分类号: H01L29/78
- IPC分类号: H01L29/78
摘要:
A semiconductor device such as a transistor with an excellent OFF characteristic even when a channel is short is provided. A periphery of a source is surrounded by an extension region and a halo region, a periphery of a drain is surrounded by an extension region and a halo region, and a substrate with low impurity concentration is not in contact with the source or the drain. Moreover, a high-work-function electrode is provided via a gate insulator, and electrons entering the vicinity of a surface of the substrate from the extension regions are eliminated. With such a structure, the impurity concentration of the channel region can be decreased even when the channel is short, and a favorable transistor characteristic can be obtained.
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