发明申请
US20120252111A1 MEASURING SYSTEM USING OPTICAL WAVEGUIDE, MEASURING DEVICE, MEASURING METHOD, OPTICAL WAVEGUIDE TYPE SENSOR CHIP, AND MAGNETIC FINE PARTICLE 有权
使用光波导的测量系统,测量装置,测量方法,光波导型传感器芯片和磁性微粒

MEASURING SYSTEM USING OPTICAL WAVEGUIDE, MEASURING DEVICE, MEASURING METHOD, OPTICAL WAVEGUIDE TYPE SENSOR CHIP, AND MAGNETIC FINE PARTICLE
摘要:
According to one embodiment, a measuring system using an optical waveguide is provided. The measuring system has an optical waveguide, magnetic fine particles, a magnetic field applying unit, a light source and a light receiving element. The optical waveguide has a sensing area to which first substances having a property of specifically bonding to subject substances to be measured are fixed. Second substances having a property of specifically bonding to the subject substances are fixed to the magnetic fine particle. The magnetic field applying unit generates a magnetic field for moving the magnetic fine particles. The light source inputs a light into the optical waveguide. The light receiving element receives the light output from the optical waveguide.
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