发明申请
- 专利标题： IN-FIELD BLOCK RETIRING
- 专利标题（中）： 现场块退火
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申请号： US13165416申请日： 2011-06-21
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公开(公告)号： US20120327713A1公开(公告)日： 2012-12-27
- 发明人: Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
- 申请人： Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
- 申请人地址： US ID Boise
- 专利权人： Micron Technology, Inc.
- 当前专利权人： Micron Technology, Inc.
- 当前专利权人地址： US ID Boise
- 主分类号： G11C16/16
- IPC分类号： G11C16/16 ; G11C16/04
摘要：
Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.
公开/授权文献
- US08514624B2 In-field block retiring 公开/授权日：2013-08-20
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