Invention Application
- Patent Title: ELECTRODE STRUCTURES, GALLIUM NITRIDE BASED SEMICONDUCTOR DEVICES INCLUDING THE SAME AND METHODS OF MANUFACTURING THE SAME
- Patent Title (中): 电极结构,基于氮化镓的半导体器件及其制造方法
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Application No.: US13489733Application Date: 2012-06-06
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Publication No.: US20130105863A1Publication Date: 2013-05-02
- Inventor: Jeong-yub Lee , Wenxu Xianyu , Chang-youl Moon , Yong-young Park , Woo-young Yang , In-jun Hwang
- Applicant: Jeong-yub Lee , Wenxu Xianyu , Chang-youl Moon , Yong-young Park , Woo-young Yang , In-jun Hwang
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2011-0110721 20111027
- Main IPC: H01L29/778
- IPC: H01L29/778 ; H01L21/338 ; B82Y99/00

Abstract:
An electrode structure, a GaN-based semiconductor device including the electrode structure, and methods of manufacturing the same, may include a GaN-based semiconductor layer and an electrode structure on the GaN-based semiconductor layer. The electrode structure may include an electrode element including a conductive material and a diffusion layer between the electrode element and the GaN-based semiconductor layer. The diffusion layer may include a material which is an n-type dopant with respect to the GaN-based semiconductor layer, and the diffusion layer may contact the GaN-based semiconductor layer. A region of the GaN-based semiconductor layer contacting the diffusion layer may be doped with the n-type dopant. The material of the diffusion layer may comprise a Group 4 element.
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