发明申请
US20130182513A1 MEMORY SYSTEM CAPABLE OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE 有权
用于校准半导体存储器件的输出电压水平的存储器系统和校准半导体存储器件的输出电压水平的方法

MEMORY SYSTEM CAPABLE OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE
摘要:
Provided are a semiconductor memory device and a memory system including the same, which may calibrate a level of an output voltage in consideration of channel environment and a mismatch in on-die termination (ODT) resistance of a memory controller. The memory system includes a memory controller and a semiconductor memory device. The semiconductor memory device is configured to generate a reference voltage based on driving information of the memory controller, and calibrate an output voltage level based on a reference voltage when the semiconductor memory device is electrically connected to the memory controller.
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