发明申请
US20130182513A1 MEMORY SYSTEM CAPABLE OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE
有权
用于校准半导体存储器件的输出电压水平的存储器系统和校准半导体存储器件的输出电压水平的方法
- 专利标题: MEMORY SYSTEM CAPABLE OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CALIBRATING OUTPUT VOLTAGE LEVEL OF SEMICONDUCTOR MEMORY DEVICE
- 专利标题(中): 用于校准半导体存储器件的输出电压水平的存储器系统和校准半导体存储器件的输出电压水平的方法
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申请号: US13611867申请日: 2012-09-12
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公开(公告)号: US20130182513A1公开(公告)日: 2013-07-18
- 发明人: Yoon-Joo EOM , Young-Jin JEON , Yong-Cheol BAE , Young-Chul CHO
- 申请人: Yoon-Joo EOM , Young-Jin JEON , Yong-Cheol BAE , Young-Chul CHO
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2012-0033938 20120402
- 主分类号: G11C5/14
- IPC分类号: G11C5/14 ; H03K19/003 ; G11C7/00
摘要:
Provided are a semiconductor memory device and a memory system including the same, which may calibrate a level of an output voltage in consideration of channel environment and a mismatch in on-die termination (ODT) resistance of a memory controller. The memory system includes a memory controller and a semiconductor memory device. The semiconductor memory device is configured to generate a reference voltage based on driving information of the memory controller, and calibrate an output voltage level based on a reference voltage when the semiconductor memory device is electrically connected to the memory controller.
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