- 专利标题： SYSTEMS AND METHODS FOR SAMPLE ANALYSIS
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申请号： US13977758申请日： 2011-12-29
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公开(公告)号： US20130344610A1公开(公告)日： 2013-12-26
- 发明人: Robert Graham Cooks , Guangtao Li , Xin Li , Zheng Ouyang
- 申请人： Robert Graham Cooks , Guangtao Li , Xin Li , Zheng Ouyang
- 申请人地址： US IN West Lafayette
- 专利权人： PURDUE RESEARCH FOUNDATION
- 当前专利权人： PURDUE RESEARCH FOUNDATION
- 当前专利权人地址： US IN West Lafayette
- 国际申请： PCT/US11/67771 WO 20111229
- 主分类号： H01J49/42
- IPC分类号： H01J49/42
摘要：
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
公开/授权文献
- US08932875B2 Systems and methods for sample analysis 公开/授权日：2015-01-13
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