发明申请
- 专利标题: MTJ MRAM WITH STUD PATTERNING
- 专利标题(中): MTJ MRAM与STUD PATTERNING
-
申请号: US13572197申请日: 2012-08-10
-
公开(公告)号: US20140042567A1公开(公告)日: 2014-02-13
- 发明人: Dong Ha Jung , Kimihiro Satoh , Jing Zhang , Yuchen Zhou , Yiming Huai
- 申请人: Dong Ha Jung , Kimihiro Satoh , Jing Zhang , Yuchen Zhou , Yiming Huai
- 主分类号: H01L43/12
- IPC分类号: H01L43/12 ; H01L43/02
摘要:
Use of a multilayer etching mask that includes a stud mask and a removable spacer sleeve for MTJ etching to form a bottom electrode that is wider than the rest of the MTJ pillar is described. The first embodiment of the invention described includes a top electrode and a stud mask. In the second and third embodiments the stud mask is a conductive material and also serves as the top electrode. In embodiments after the stud mask is formed a spacer sleeve is formed around it to initially increase the masking width for a phase of etching. The spacer is removed for further etching, to create step structures that are progressively transferred down into the layers forming the MTJ pillar. In one embodiment the spacer sleeve is formed by net polymer deposition during an etching phase.
公开/授权文献
- US08772888B2 MTJ MRAM with stud patterning 公开/授权日:2014-07-08
信息查询
IPC分类: