Invention Application
- Patent Title: TECHNIQUES FOR IMPROVING RELIABILITY AND PERFORMANCE OF PARTIALLY WRITTEN MEMORY BLOCKS IN MODERN FLASH MEMORY SYSTEMS
- Patent Title (中): 改进现代闪存系统中部分书面记忆块的可靠性和性能的技术
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Application No.: US14318572Application Date: 2014-06-27
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Publication No.: US20150380095A1Publication Date: 2015-12-31
- Inventor: YOGESH B. WAKCHAURE , ALIASGAR S. MADRASWALA , KRISTOPHER H. GAEWSKY , CHARAN SRINIVASAN
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G11C16/14
- IPC: G11C16/14 ; G11C16/26

Abstract:
Methods and apparatus to improve reliability and/or performance of partially written memory blocks in flash memory systems are described. In some embodiments, a storage device stores information corresponding to a partial write operation performed on a partially programmed memory block of a non-volatile memory. Memory controller logic then cause application of a reduced voltage level and/or an offset value to portion(s) of the non-volatile memory during a read or write operation to the non-volatile memory based at least in part on the stored information. Other embodiments are also disclosed and claimed.
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