Invention Application
US20160064086A1 CIRCUIT AND METHOD FOR ADJUSTING SELECT GATE VOLTAGE OF NON-VOLATILE MEMORY
有权
用于调整非易失性存储器的选择栅极电压的电路和方法
- Patent Title: CIRCUIT AND METHOD FOR ADJUSTING SELECT GATE VOLTAGE OF NON-VOLATILE MEMORY
- Patent Title (中): 用于调整非易失性存储器的选择栅极电压的电路和方法
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Application No.: US14471769Application Date: 2014-08-28
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Publication No.: US20160064086A1Publication Date: 2016-03-03
- Inventor: Shuo-Nan Hung , Shin-Jang Shen , Wei-Jen Chen
- Applicant: MACRONIX International Co., Ltd.
- Main IPC: G11C16/14
- IPC: G11C16/14

Abstract:
A circuit for adjusting a select gate voltage of a non-volatile memory is provided. The circuit includes a well, a select gate, an adjustment unit, and a switch. There is a capacitive coupling between the well and the select gate. The adjustment unit generates a driving voltage for the select gate. The switch is coupled in series with the adjustment unit between the select gate and the well.
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