Invention Application
- Patent Title: STRUCTURAL ILLUMINATION AND EVANESCENT COUPLING FOR THE EXTENSION OF IMAGING INTERFEROMETRIC MICROSCOPY
- Patent Title (中): 扩展成像干涉显微镜的结构照明与变化耦合
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Application No.: US14230582Application Date: 2014-03-31
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Publication No.: US20160161731A1Publication Date: 2016-06-09
- Inventor: STEVEN R.J. BRUECK , YULIYA KUZNETSOVA , ALEXANDER NEUMANN
- Applicant: STEVEN R.J. BRUECK , YULIYA KUZNETSOVA , ALEXANDER NEUMANN
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G01B9/02

Abstract:
In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for three-dimensional imaging interferometric microscopy (IIM), which can use at least two wavelengths to image a three-dimensional object. The apparatus can include a first, a second, and a third optical system. The first optical system is disposed to provide a substantially coherent illumination to the 3D object, wherein the illumination is characterized by a plurality of wavelengths. The second optical system includes an optical image recording device and one or more additional optical components characterized by a numerical aperture NA. The third optical system provides interferometric reintroduction of a portion of the coherent illumination as a reference beam into the second optical system. An image recording device records each sub-image formed as a result of interference between the illumination that is scattered by the 3D object and the reference beam.
Public/Granted literature
- US09541374B2 Structural illumination and evanescent coupling for the extension of imaging interferometric microscopy Public/Granted day:2017-01-10
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