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    Block stacking game
    1.
    外观设计
    Block stacking game 有权

    公开(公告)号：USD989184S1

    公开(公告)日：2023-06-13

    申请号：US29798104

    申请日：2021-07-06

    申请人： Alexander Neumann

    设计人： Alexander Neumann

    摘要： FIG. 1 is a top perspective view of the block stacking game;
    FIG. 2 is a top perspective exploded view thereof;
    FIG. 3 is a top view thereof;
    FIG. 4 is a bottom view thereof;
    FIG. 5 is a right side view thereof;
    FIG. 6 is a left side view thereof;
    FIG. 7 is a back view thereof; and,
    FIG. 8 is a front view thereof.
    The claim is directed to the collective appearance of the block stacking game set shown in the figures. The components of the set are arranged on the drawing sheet for the convenience of illustration, and the relative positioning of the block stacking game forms no part of the claimed design.

    IMAGING INTERFEROMETRIC MICROSCOPY
    6.
    发明申请
    IMAGING INTERFEROMETRIC MICROSCOPY 有权
    成像干涉显微镜

    公开(公告)号：US20110211253A1

    公开(公告)日：2011-09-01

    申请号：US13087297

    申请日：2011-04-14

    申请人： Steven R. J. Brueck ,  Alexander Neumann ,  Yuliya V. Kuznetsova

    发明人： Steven R. J. Brueck ,  Alexander Neumann ,  Yuliya V. Kuznetsova

    IPC分类号： G02B21/06

    CPC分类号： G02B21/18 ,  G02B21/06 ,  G02B21/367

    摘要： Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and λ is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ.

    摘要翻译： 示例性实施例提供图像干涉显微镜（IIM）和用于图像干涉显微镜的方法。 所公开的IIM可以通过使用多个离轴照明来接近高分辨率的光学系统的光学分辨率的线性系统极限，以及在光学系统的低NA侧上的零级参考光束的干涉重新引入。 在一些实施例中，薄物体可以垂直于光轴放置，并且频率空间极限可以扩展到约[（1 + NA）n /λ]，其中NA是所用物镜的数值孔径，n 是传输介质的折射率，λ是光波长。 在其他实施例中，倾斜物平面可以进一步允许将衍射信息收集到材料透射带通限制空间频率约2n /λ。

    Imaging interferometric microscopy
    8.
    发明授权
    Imaging interferometric microscopy 有权
    成像干涉显微镜

    公开(公告)号：US08203782B2

    公开(公告)日：2012-06-19

    申请号：US13087297

    申请日：2011-04-14

    申请人： Steven R. J. Brueck ,  Alexander Neumann ,  Yuliya V. Kuznetsova

    发明人： Steven R. J. Brueck ,  Alexander Neumann ,  Yuliya V. Kuznetsova

    IPC分类号： G02B21/00

    CPC分类号： G02B21/18 ,  G02B21/06 ,  G02B21/367

    摘要： Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and λ is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ.

    摘要翻译： 示例性实施例提供图像干涉显微镜（IIM）和用于图像干涉显微镜的方法。 所公开的IIM可以通过使用多个离轴照明来接近高分辨率的光学系统的光学分辨率的线性系统极限，以及在光学系统的低NA侧上的零级参考光束的干涉重新引入。 在一些实施例中，薄物体可以垂直于光轴放置，并且频率空间极限可以扩展到约[（1 + NA）n /λ]，其中NA是所用物镜的数值孔径，n 是传输介质的折射率，λ是光波长。 在其他实施例中，倾斜物平面可以进一步允许将衍射信息收集到材料透射带通限制空间频率约2n /λ。