发明申请
- 专利标题: POLYMER, RESIST COMPOSITION, AND PATTERN FORMING PROCESS
- 专利标题(中): 聚合物,抗蚀剂组合物和图案形成过程
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申请号: US14960978申请日: 2015-12-07
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公开(公告)号: US20160168296A1公开(公告)日: 2016-06-16
- 发明人: Jun Hatakeyama , Kenji Funatsu , Teppei Adachi
- 申请人: SHIN-ETSU CHEMICAL CO., LTD.
- 申请人地址: JP Tokyo
- 专利权人: SHIN-ETSU CHEMICAL CO., LTD.
- 当前专利权人: SHIN-ETSU CHEMICAL CO., LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2014-249749 20141210
- 主分类号: C08F224/00
- IPC分类号: C08F224/00 ; G03F7/32 ; C08F216/10 ; G03F7/16 ; G03F7/20 ; C08F236/20 ; G03F7/039 ; C08F220/68
摘要:
A polymer comprising recurring units having an acid generator bound to the backbone, and recurring units having an optionally acid labile group-substituted carboxyl group and/or recurring units having an optionally acid labile group-substituted hydroxyl group is obtained by polymerizing corresponding monomers under such illumination that the quantity of light of wavelength up to 400 nm is up to 0.05 mW/cm2. The polymer avoids photo-decomposition of the acid generator during polymerization and concomitant deprotection reaction of the acid labile group when used in positive resist compositions. A pattern with high dissolution contrast and rectangularity is formed after development.
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