Invention Application
US20160169938A1 METHOD OF ANALYZING SURFACE OF SAMPLE USING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE THEREFOR
审中-公开
使用扫描探针显微镜和扫描探针显微镜分析样品表面的方法
- Patent Title: METHOD OF ANALYZING SURFACE OF SAMPLE USING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE THEREFOR
- Patent Title (中): 使用扫描探针显微镜和扫描探针显微镜分析样品表面的方法
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Application No.: US14949623Application Date: 2015-11-23
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Publication No.: US20160169938A1Publication Date: 2016-06-16
- Inventor: Youngnam Kwon , Sungjun Park , Woonjung Paek , Seongheon Kim , Jaemin Ahn , Dongjin Yun
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2014-0177823 20141210
- Main IPC: G01Q20/02
- IPC: G01Q20/02 ; C12Q1/10
Abstract:
Provided are methods for analyzing a surface of a sample using a scanning probe microscope including a cell-attached probe and scanning probe microscopes therefor.
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