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公开(公告)号:US20160169938A1
公开(公告)日:2016-06-16
申请号:US14949623
申请日:2015-11-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngnam Kwon , Sungjun Park , Woonjung Paek , Seongheon Kim , Jaemin Ahn , Dongjin Yun
IPC: G01Q20/02 , C12Q1/10
CPC classification number: G01Q20/02 , C12N11/06 , C12Q1/10 , G01N33/54373 , G01Q60/42 , G01Q70/06
Abstract: Provided are methods for analyzing a surface of a sample using a scanning probe microscope including a cell-attached probe and scanning probe microscopes therefor.
Abstract translation: 提供了使用包括细胞附着探针和扫描探针显微镜的扫描探针显微镜来分析样品表面的方法。