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1.发明申请METHOD OF ANALYZING SURFACE OF SAMPLE USING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE THEREFOR 审中-公开使用扫描探针显微镜和扫描探针显微镜分析样品表面的方法公开(公告)号：US20160169938A1
公开(公告)日：2016-06-16
申请号：US14949623
申请日：2015-11-23
发明人： Youngnam Kwon , Sungjun Park , Woonjung Paek , Seongheon Kim , Jaemin Ahn , Dongjin Yun
摘要： Provided are methods for analyzing a surface of a sample using a scanning probe microscope including a cell-attached probe and scanning probe microscopes therefor.
摘要翻译： 提供了使用包括细胞附着探针和扫描探针显微镜的扫描探针显微镜来分析样品表面的方法。
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2.发明授权公开(公告)号：US11158865B2
公开(公告)日：2021-10-26
申请号：US16729917
申请日：2019-12-30
发明人： Hyunjin Kim , Wonsung Choi , Mokwon Kim , Seongheon Kim , Dongmin Im , Kyounghwan Choi
摘要： A cathode configured to use oxygen as a cathode active material comprising a conductive layer including an electronic conductor, wherein the conductive layer is free of pores.
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3.发明申请公开(公告)号：US20200212451A1
公开(公告)日：2020-07-02
申请号：US16729917
申请日：2019-12-30
发明人： Hyunjin Kim , Wonsung Choi , Mokwon Kim , Seongheon Kim , Dongmin Im , Kyounghwan Choi
摘要： A cathode configured to use oxygen as a cathode active material comprising a conductive layer including an electronic conductor, wherein the conductive layer is free of pores.
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