Invention Application
- Patent Title: PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- Patent Title (中): 等离子体加工设备和等离子体处理方法
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Application No.: US15079381Application Date: 2016-03-24
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Publication No.: US20160203951A1Publication Date: 2016-07-14
- Inventor: Yohei YAMAZAWA , Chishio KOSHIMIZU , Kazuki DENPOH , Jun YAMAWAKU , Masashi SAITO
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Priority: JP2009-245988 20091027; JP2009-245991 20091027; JP2010-215119 20100927
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23C16/455 ; C23C16/50

Abstract:
A plasma processing apparatus includes a processing chamber including a dielectric window; a coil shaped RF antenna provided outside the dielectric window; a substrate supporting unit, provided in the processing chamber, for mounting thereon a target substrate to be processed; a processing gas supply unit for supplying a desired processing gas to the processing chamber to perform a desired plasma process on the target substrate; and an RF power supply unit for supplying an RF power to the RF antenna to generate a plasma of the processing gas by an inductive coupling in the processing chamber. The apparatus further includes a floating coil electrically floated and arranged at a position outside the processing chamber where the floating coil is to be coupled with the RF antenna by an electromagnetic induction; and a capacitor provided in a loop of the floating coil.
Public/Granted literature
- US10804076B2 Plasma processing apparatus and plasma processing method Public/Granted day:2020-10-13
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