Invention Application
- Patent Title: METHOD FOR PRODUCING SiC EPITAXIAL WAFER
- Patent Title (中): 生产SiC外延晶片的方法
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Application No.: US14913865Application Date: 2014-08-13
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Publication No.: US20160208414A1Publication Date: 2016-07-21
- Inventor: Michiya ODAWARA , Yutaka TAJIMA , Daisuke MUTO , Kenji MOMOSE
- Applicant: SHOWA DENKO K.K.
- Applicant Address: JP Tokyo
- Assignee: SHOWA DENKO K.K.
- Current Assignee: SHOWA DENKO K.K.
- Current Assignee Address: JP Tokyo
- Priority: JP2013-183373 20130904
- International Application: PCT/JP2014/071380 WO 20140813
- Main IPC: C30B25/18
- IPC: C30B25/18 ; H01L21/02 ; C30B29/36

Abstract:
The method for producing an SiC epitaxial wafer according to the present invention includes: a step of vacuum baking a coated carbon-based material member at a degree of vacuum of 2.0×10−3 Pa or less in a dedicated vacuum baking furnace; a step of installing the coated carbon-based material member in an epitaxial wafer manufacturing apparatus; and a step of placing an SiC substrate in the epitaxial wafer manufacturing apparatus and epitaxially growing an SiC epitaxial film on the SiC substrate.
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