Invention Application
- Patent Title: MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS
- Patent Title (中): 水分检测和成像监测系统
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Application No.: US14706322Application Date: 2015-05-07
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Publication No.: US20160327502A1Publication Date: 2016-11-10
- Inventor: Fen CHEN , Jeffrey P. GAMBINO , Carole D. GRAAS , Wen LIU , Prakash PERIASAMY
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Main IPC: G01N27/22
- IPC: G01N27/22

Abstract:
Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit.
Public/Granted literature
- US10126260B2 Moisture detection and ingression monitoring systems and methods of manufacture Public/Granted day:2018-11-13
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