Invention Application
US20160341780A1 TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT 有权
发射机配置用于测试信号注射到测试交流耦合互连

TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT
Abstract:
In one example, a driver circuit includes a differential transistor pair configured to be biased by a current source and including a differential input and a differential output. The driver circuit further includes a resistor pair coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor.
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