Invention Application
- Patent Title: PATH ISOLATION IN A MEMORY DEVICE
- Patent Title (中): 存储器件中的路径隔离
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Application No.: US15261301Application Date: 2016-09-09
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Publication No.: US20170069382A1Publication Date: 2017-03-09
- Inventor: Hernan A. Castro
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
Embodiments of the present disclosure describe techniques and configurations for word-line path isolation in a phase change memory (PCM) device. In one embodiment, a memory device includes a memory cell of a memory device, a bit-line coupled to the memory cell, a word-line coupled to the memory cell, a bit-line electrode coupled to the bit-line, a word-line electrode coupled to the word-line, current-limiting circuitry of a selection module coupled to one of the word-line electrode and the bit-line electrode having a lower potential, the current-limiting circuitry to facilitate a selection operation of the memory cell by the selection module, sensing circuitry coupled to the one of the word-line electrode and the bit-line electrode having the lower potential, the sensing circuitry to perform a read operation of the memory cell, and write circuitry coupled to the one of the word-line electrode and the bit-line electrode having the lower potential, the write circuitry to perform a write operation of the memory cell. Other embodiments may be described and/or claimed.
Public/Granted literature
- US09691481B2 Path isolation in a memory device Public/Granted day:2017-06-27
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