Invention Application
US20170069382A1 PATH ISOLATION IN A MEMORY DEVICE 有权
存储器件中的路径隔离

  • Patent Title: PATH ISOLATION IN A MEMORY DEVICE
  • Patent Title (中): 存储器件中的路径隔离
  • Application No.: US15261301
    Application Date: 2016-09-09
  • Publication No.: US20170069382A1
    Publication Date: 2017-03-09
  • Inventor: Hernan A. Castro
  • Applicant: Intel Corporation
  • Applicant Address: US CA Santa Clara
  • Assignee: Intel Corporation
  • Current Assignee: Intel Corporation
  • Current Assignee Address: US CA Santa Clara
  • Main IPC: G11C13/00
  • IPC: G11C13/00
PATH ISOLATION IN A MEMORY DEVICE
Abstract:
Embodiments of the present disclosure describe techniques and configurations for word-line path isolation in a phase change memory (PCM) device. In one embodiment, a memory device includes a memory cell of a memory device, a bit-line coupled to the memory cell, a word-line coupled to the memory cell, a bit-line electrode coupled to the bit-line, a word-line electrode coupled to the word-line, current-limiting circuitry of a selection module coupled to one of the word-line electrode and the bit-line electrode having a lower potential, the current-limiting circuitry to facilitate a selection operation of the memory cell by the selection module, sensing circuitry coupled to the one of the word-line electrode and the bit-line electrode having the lower potential, the sensing circuitry to perform a read operation of the memory cell, and write circuitry coupled to the one of the word-line electrode and the bit-line electrode having the lower potential, the write circuitry to perform a write operation of the memory cell. Other embodiments may be described and/or claimed.
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