发明申请
- 专利标题: METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE
- 专利标题(中): 制造半导体基板的方法
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申请号: US15183869申请日: 2016-06-16
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公开(公告)号: US20170069785A1公开(公告)日: 2017-03-09
- 发明人: Young Jo TAK , Sam Mook KANG , Mi Hyun KIM , Jun Youn KIM , Young Soo PARK , Misaichi TAKEUCHI
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2015-0126184 20150907
- 主分类号: H01L33/00
- IPC分类号: H01L33/00 ; H01L21/02 ; H01L21/78 ; H01L21/683 ; H01L21/306
摘要:
A method of manufacturing a semiconductor substrate may include forming a first semiconductor layer on a growth substrate, forming a second semiconductor layer on the first semiconductor layer, forming a plurality of voids in the first semiconductor layer by removing portions of the first semiconductor layer that are exposed by a plurality of trenches in the second semiconductor layer, forming a third semiconductor layer on the second semiconductor layer and covering the plurality of trenches, and separating the second and third semiconductor layers from the growth substrate. on the first semiconductor layer. The third semiconductor layer are grown from the second semiconductor layer and extend above the second semiconductor layer.
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