- 专利标题: SYSTEMS AND METHODS FOR ANALYZING A SAMPLE FROM A SURFACE
-
申请号: US15318846申请日: 2015-06-16
-
公开(公告)号: US20170140912A1公开(公告)日: 2017-05-18
- 发明人: Zheng Ouyang , Xiao Wang , Xiaoyu Zhou
- 申请人: Purdue Research Foundation
- 申请人地址: US IN West Lafayette
- 专利权人: Purdue Research Foundation
- 当前专利权人: Purdue Research Foundation
- 当前专利权人地址: US IN West Lafayette
- 国际申请: PCT/US15/35935 WO 20150616
- 主分类号: H01J49/04
- IPC分类号: H01J49/04 ; H01J49/00 ; H01J49/24
摘要:
The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.
公开/授权文献
- US09960028B2 Systems and methods for analyzing a sample from a surface 公开/授权日:2018-05-01
信息查询